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Verity測量儀器  
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  上海武田機電,總部設在上海,在香港,德國,美國,日本均設有分公司,擁有良好的購銷渠道,歡迎來電咨詢 TEL:0086-21-51085793
         
 

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武田機電

Verity測量儀器

Instruments > Spectrograph SD1024F? > Spectrograph SD1024FH? > Spectrograph SD1024DL? > Spectrograph SD2048DL? > Spectral Reflectomer SP2006? > Portable Spectrograph PPDS > Monochromator EP Series > Detectors PM100? Series > Dual Detectors PM200? Series System Controllers > VM3000/3400 > SDC2006?

Verity Instruments is a manufacturer of optical emission instruments and software applications for endpoint detection, and advanced process control, and film thickness measurement. Verity's optical emission-based instruments include spectrographs, monochromators and interference filter-based detectors. These products are used for endpoint determination in etch, ion beam etch, CVD etchback, photoresist strip, chemical/mechanical polishing (CMP) and other processes. Verity instrumentation also provides for plasma diagnostics, process development, process control and film thickness measurement. The development of advanced signal processing algorithms permits Verity to offer solutions for low-exposed area endpoint and other complex signal processing applications. Advanced software applications include proprietary pattern recognition (Neural Network) and multi-wavelength algorithms. The SD1024F? spectrograph features a back-thinned 1024-element CCD detector array, which enables simultaneous measurement of all wavelengths from 200 to 800nm. When the SD1024F is combined with a xenon flashlamp, the resulting system can be used for in-situ or in-line film thickness or depth measurement. General-purpose instruments, including manual monochromators, analyze a single wavelength at a time. Monochromators and compact, cost-effective interference filter-based detectors use a photomultiplier tube as a detector. This broad range of instruments allows Verity to supply customers with the level of performance required for their application.

 
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